1. Materials and Physical Properties of High-k Oxides, Ran Liu, Materials Fundamentals of Gate Dielectrics, Ed. by A.A. Demkov and A. Navrotsky (eds.),
2. Raman Characterization of Si/Si1-xGex Heterostructures, Ran Liu, SiGeC Alloys: Growth, Properties, and Devices, Ed. By S.T. Pantelides and S. Zollner, Taylor & Francis Books, Inc.