Department of Optical Science and Engineering
Professional Title:Associate Professor
Position:Vice director of engineering center
Email:zxchao@fudan.edu.cn
Visiting Address:Room 405, Building of Advanced Materials, Fudan University, 2005 Songhu Road, Yangpu, Shanghai, 200438 PR China
Tel:021-51630347
Curriculum Vitae
Xiangchao Zhang, born in 1982, is currently an associate professor at Fudan University, China. He is a Senior Member of SPIE, and a member of ISO TC/201, OSA, ASPE, IEEE, and Shanghai Laser Society, and a trustee of Precision Machinery Sub-Society of China Instrument and Control Society. He graduated from University of Science and Technology of China in 2005 and received his PhD degree at University of Huddersfield, UK in 2009. In 2011, he joined Department of Optical Science and Engineering, Fudan University, China. Dr Zhang’s research interests include precision optical measurement, surface metrology and precision optics polishing. He has achieved a series of important results on deflectometric measurement, freeform surface characterisation, multi-scale analysis, digital holographic microscopy etc and published more than 100 papers. He has leaded several research grants including National Natural Science Foundation of China, Shanghai Natural Science Foundation, Science Challenging Program, National Key Research and Development Program of China etc. He won a best paper prize in Met & Props 2011 and a Second Prize of Science and Technology Development, Ministry of Education of China. He is a youth editor of Advances in Manufacturing etc and a peer reviewer of more than 30 international journals and a project reviewer of NSFC of China and EPSRC of UK.
Research Interests
Precision optical measurement
Deflectometry, digital holographic microscopy, interferometry etc
Surface metrology
Characterisation of structured surfaces, multiscale analysis of morphological features, form error evaluation of freeform surfaces, etc
Academic Positions
Senior Member of SPIE
Vice director of Youth Committee of Shanghai Laser Society
Member of IEEE and ASPE
Trustee of Precision Machinery Sub-Society of China Instrument and Control Society
Project reviewer of National Natural Science Foundation of China and EPSRC, UK
Youth Editor of Advances in Manufacturing
Awards
2016 | Second prize of Technological Progress, Ministry of Education |
2016 | NSFC rated excellence |
2015 | Outstanding tutor of Tengfei College, Fudan University |
2014 | Outstanding tutor of Tengfei College, Fudan University |
2013 | Second faculty prize, Fudan University. |
| Outstanding staff in annual assessment, Fudan University. |
2011 | Best paper prize of 13th International Conference on Metrology and Properties of Engineering Surfaces, National Physical Laboratory, UK. |
Education and Working Experience
Associate professor 12/2011-present | Department of Optical Science and Engineering, Fudan University, |
Research Fellow 12/2008-09/2011 | Centre for Precision Technologies, University of Huddersfield, UK |
Ph.D 09/2005-06/2009 | Centre for Precision Technologies, University of Huddersfield, UK |
BEng (Hons) 09/2001-07/2005 | Department of Precision Machinery and Precision Instrumentation, University of Science and Technology of China, China |
Teaching
Undergraduate courses: Linear Algebra, Optical Measurement Technology and Applied Optics
Publications
L Ye, W Wang*, X Zhang, M Xu, J Zhang and L Zheng. Testing of large-aperture aspheric mirrors using a single coated lens. Applied Optics 2020;59(15):4577-4582
J Ye, Z Niu, X Zhang, W Wang* and M Xu. In-situ deflectometic measurement of transparent optics in precision robotic polishing. Precision Engineering 2020;64:63-69
Z Niu, X Zhang*, J Ye, Y Zhu, M Xu and X Jiang. Flexible one-shot geometric calibration for the off-axis deflectometry. Applied Optics 2020;59(13):3819-3824
Y Cheng, X Zhang*, H Yuan, W Wang and M Xu. Precision enhancement of three-dimensional displacement tracing for nano-fabrication based on low coherence interferometry. Optics Express 2019;27(20):28324-28336
X Xu, X Zhang*, Z Niu, W Wang, Y Zhu and M Xu. Extra-detection-free monoscopic deflectometry for the in-situ measurement of freeform specular surfaces. Optics Letters 2019; 44(17):4271-4274
Z Niu, X Xu, X Zhang*, W Wang, Y Zhu, J Ye, M Xu and X Jiang. Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry. Optics Express 2019;27(6):8195-8207
X Xu, X Zhang*, Z Niu, W Wang, Y Zhu and M Xu. Self-calibration of in-situ monoscopic deflectometric measurement in precision optical manufacturing. Optics Express 2019; 27(4):7523-7536
S Wan, X Zhang*, W Wang and M Xu. Effect of pad wear on tool influence function in robotic polishing of large optics. The International Journal of Advanced Manufacturing Technology.2019; 102(5-8):2521-2530
S Wan, X Zhang*, H Zhang, M Xu, W Wang and X Jiang. Edge control in precision robotic polishing based on space-variant deconvolution. Precision Engineering 2019;55:110-118
S Wan, X Zhang*, M Xu, W Wang and X Jiang. Region-adaptive path planning for precision optical polishing with industrial robots. Optics Express 2018;26(18):23782-23795
X Zhang, J Wang, X Zhang*, M Xu and X Jiang. Correction of phase-shifting error in wavelength scanning digital holographic microscopy. Measurement Science and Technology 2018;29:055002
S Wan, X Zhang*, M Xu and X Jiang. Modelling and analysis of sub-aperture tool influence functions for polishing complex curved surfaces. Precision Engineering 2018;51:415-425
X Zhang, X Zhang*, M Xu, H Zhang and X Jiang. Accurate reconstruction in digital holography microscopic measurement of micro-structures using anti-aliasing shift invariant contourlet transform. Optical Engineering 2018;57(3):034108
X Zhang, X Zhang*, M Xu, H Zhang and X Jiang. Phase unwrapping in digital holography based on non-subsampled contourlet transform. Optics Communications 2018;407:367-374
H Yang, X Zhang*, H Zhang, X He, H Xiao and M Xu. Feature preserving filtering for micro-structured surfaces using combined sparse regularizers. Measurement 2017;104:278-286
S Wan, X Zhang, X He and M Xu. Modelling of edge effect in sub-aperture tool influence functions of computer controlled optical surfacing. Applied Optics 2016; 10223-10228
X He, M Xu and X Zhang. Theoretical investigation of a broadband all-optical graphene-microfiber modulator. Journal of the Optical Society of America B 2016;33(12):2588-2595
H Zhang, M Zhou, Y Wang, X Zhang, Y Yan and R Wang. Development of a quantitative method for the characterization of hole quality during laser trepan drilling of high-temperature alloy. Applied Physics A 2016;122:74
X He, M Xu, X Zhang and H Zhang. A tutorial introduction to graphene-microfiber waveguide and its applications. Frontiers of Optoelectronis 2016:1-9
X Zhang, X Zhang*, H Xiao and M Xu. Speckle removal in phase reconstruction of digital holography for structured surfaces. Infrared and Laser Engineering, 2016;45(7):0726002
B Peng, H Zhang, H Shao, Y Xu, X Zhang and H Zhu. Low lattice thermal conductivity of stanene. Scientific Reports 2016;6:20225
L Li, X Zhang*, H Xiao and M Xu. Segmentation of non-stochastic surfaces based on non-subsampled contourlet transform and mathematical morphologies. Measurement,2016;79:137-146
L Lv, X Zhang* and M Xu. Analysis of geometrical qualities and functionalities of pupil-filters used for super-resolution imaging. Acta Photonica Sinica 2015;44(10): 1022001
L Li, X Zhang*, H Zhang, X He and M Xu. Feature extraction of non-stochastic surfaces using curvelets. Precision Engineering, 2015;39:212-219
B Chen, X Zhang*, H Zhang, X He and M Xu. Investigation of error separation for three dimensional rotary profile measuring system. Measurement, 2014; 47:627-632
X He*, X Zhang, H Zhang, M Xu. Graphene covered on microfiber exhibiting polarization and polarization-dependent saturable absorption. IEEE J. Selected Topics in Quantum Electronics, 2014;20(1):4500107
X Zhang*, M Xu, H Zhang, X He and X Jiang. Chebyshev fitting of complex surfaces for precision metrology. Measurement, 2013;46 (9): 3720-2024
Y Chen, X Zhang*, T Luo, X Liu and W Huang. Fabrication and characterization of areal roughness specimens for applications in scanning probe microscopy. Measurement Science and Technology, 2013;24(5):055402
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