师资队伍
张祥朝
Professional Title：
Position：工程中心副主任
Email：zxchao@fudan.edu.cn
Visiting Address：江湾校区交叉二号楼C3013
Tel：021-31242566
Home Page：
Research Interests
- 精密光学测量技术 (Precision optical measurement) 包括光学干涉测量技术、数字全息显微术、偏折术等
- 计算成像 (Computational imaging) 包括超分辨显微技术、压缩感知与去噪、深度学习等
-
复杂表面评定表征 (Metrology of complex surfaces) 包括自由曲面与结构表面的形貌表征、多尺度分析以及标准化等
Academic Positions
ISO TC213委员，国标委TC240委员，SPIE、中国光学学会高级会员，上海惯性技术学会理事，中国仪器仪表学会精密机械分会、集成电路测量与仪器分会、中国图象图形学学会视觉检测专委会委员，国家自然科学基金委员会、英国EPSRC项目评审专家、Surface Topography: Metrology and Properties、光学精密工程等期刊编委。
Awards
2024年 《光学检测技术》获上海市一流本科课程
2023年 中国光学工程学会科技进步二等奖
2023年 第十届全国大学生光电设计竞赛三等奖，东部赛区一等奖，指导教师
2023年 复旦大学睿郡奖教金
2023年 复旦大学第三届教学创新大赛特等奖
2023年 复旦大学信息科学与工程学院院长奖
2022年 复旦大学睿郡奖教金
2022年 日内瓦国际发明展金奖
2021年 10th International Symposium on Precision Mechanical Measurement最佳论文奖
2021年 复旦大学信息科学与工程学院联防联控“优秀团队奖”
2020年 IFOSA国际会议Most Impact Award
2019年 SPIE高级会员
2018年 全国大学生光电设计竞赛三等奖指导教师
2018年 Measurement优秀评审人
2016年 教育部科技进步二等奖，第三完成人
2016年 国家自然科学基金项目结题优秀，在结题会议上受邀做宣讲报告
2015年 复旦大学腾飞书院优秀班导师
2014年 复旦大学腾飞书院优秀班导师
2013年 复旦大学二等奖教金
Education and Working Experience
2022.12至今 | 复旦大学光科学与工程系 | 研究员 |
2018.4至今 | 上海超精密光学制造工程技术中心 | 副主任 |
2011.12-2022.12 | 复旦大学光科学与工程系 | 副研究员 |
2009.7-2011.9 | 英国哈德斯菲尔德大学精密技术中心 | 研究学者 |
2005.9-2009.6 | 英国哈德斯菲尔德大学精密技术中心 | 博士生 |
2001.9-2005.7 | 中国科学技术大学 | 本科生 |
Teaching
本科生课程：线性代数，光学检测技术，应用光学，数学物理方法
Publications
| Y Chen, W Lang, T Chen, X Niu, X Zhang*. Enhancing the efficiency and determinacy of in-situ monoscopic phase measuring deflectometry by Bayesian approach. Precision Engineering 2025;94:693-699 |
| W Lang, X Zhang*, Y Chen, T Chen, P Yang, M Xu, X Jiang. Deterministic form-position deflectometric measurement of monolithic multi-freeform optical structures via Bayesian multisensor fusion. Light: Advanced Manufacturing 2025;6:29 |
| X Zhang*, X Ma, S Rong. Physics-informed and self-supervised multi-image super-resolution reconstruction for digital holography microscopy. Surface Topography: Metrology and Properties 2025;13:015034 |
| Z Hua , X Zhang, D Tu , X Zhang. Three-dimensional topography measurement for confocal microscopy with arrayed laser spots. IEEE Transactions on Instrumentation and Measurement 2025;74:5024816 |
| P Yang, T Chen, D Wang, L Ye, Y Chen, W Lang, X Zhang*. Recognition and separation of fringe patterns in deflectometric measurement of transparent elements based on empirical curvelet transform. Measurement 2024;237(1):115242 |
| T Chen, P Yang, W Lang, Y Chen, W Wang, X Zhang*. Integrated form-position measurement of large-aperture transparent elements based on stereoscopic phase measuring deflectometry. Surface Topography: Metrology and Properties 2024;12:025023 |
| T Chen, P Yang, X Zhang*, W Lang, Y Chen, M Xu. Separation of fringe patterns in fast deflectometric measurement of transparent optical elements based on neural network-assisted fast iterative filtering method. Advances in Manufacturing 2024;s40436-024-00509-w |
| R Xiong, X Zhang*, X Ma, L Li, Z Ni, X Jiang. Adaptive coded phase mask design and high-quality image reconstruction for interference-less coded aperture correlation holography. Optics Express 2024;32(7):12747-12762 |
| Y Chen, X Zhang*, W Lang, T Chen, Z Hu, X Jiang. Simplifying the monoscopic deflectometric measurement by extra-facility-free workpiece positioning. Precision Engineering 2024;87:97-105 |
| W Lang, X Zhang*, Y Chen, T Chen and X Jiang. Holistic calibration method of deflectometry by holonomic framework priors. Optics Letters 2024;49(3):702-705 |
| Q Lu, W Gong, Y Sun, W Wang, X Zhang, P Wang, Y Ding, W Wang*, S Liu, X Zhang, M Xu, J Shao.Fast, intelligent and high-precision adaptive interferometry for optical freeform surfaces by backpropagation. Optics Express 2024;32(2):2658-2669 |
| T Chen, Y Chen, W Lang, X Zhang, W Wang*, M Xu. In-situ sub-aperture stitching measurement based on monoscopic phase measuring deflectometry. Precision Engineering 2024;85(1):197-204 |
| C Wang, W Wang, J Wei, J Wu, X Zhang, H Zheng, F Wang, Y Yu. A phase-based reconstruction optimization method for digital holographic measurement of microstructures. Applied Optics 2023;62(17): 4530-4535 |
| W Lang, X Zhang*, Y Chen, T Chen, Z Hu and X Jiang. A general reconstruction framework for deflectometric measurement based on non-uniform B-splines. IEEE Transactions on Instrumentation and Measurement 2023;72(5): 5015511 |
| Z Hu, X Zhang*, W Lang, Y Chen, T Chen and M Xu. Fast measurement of surface topographies using a phase-measuring deflectometric microscopy. IEEE Photonics Journal 2023;15(2):6800807 |
| J Wang, L Peng, F Zhai, D Tang*, F Gao, X Zhang*, R Chen, L Zhou* and X Jiang. Polarized angle-resolved spectral reflectometry for real-time ultra-thin film. Optics Express 2023;31(4):6552-6565 |
| X Zhang*, H Yuan, R Xiong, J Wang*, X Ma, Z Hu and M Xu. Fast measurement of surface defects on large components with dynamic phase-shifting digital holographic microscopy. Measurement 2023;208(1):112443 |
| R Xiong, X Zhang*, X Ma, L Li, J Wang* and X Jiang. Full-dimensional surface characterization based on polarized coherent coded aperture correlation holography. IEEE Photonics Journal 2022;14(6):3160407 |
| K Wang,YQ Zhu,QC An, XC Zhang, C Peng, HR Meng and XY Liu. An even sampling photonic-integrated interferometric array for synthetic aperture imaging. Optics Express 2022;30(18):32119-32128 |
| F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Depth multiplexing of orbital angular momentum holography. Optics Express 2022;30(18):31863-31871 |
| Z Niu, Z Wu, S Wan, X Zhang*, C Wei*, J Shao. Iterative space-variant sphere-model deflectometry enabling designation-model-free measurement of the freeform surface. Optics Express 2022;30(9):14019-14032 |
| F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Angular multiplexation of partial helical phase modes in orbital angular momentum holography. Optics Express 2022;30(7):11110-11119 |
| T Chen, Y Chen, X Zhang, W Wang*, M Xu. Workpiece positioning and error decoupling in the single-point diamond turning of freeform mirrors based on the monoscopic deflectometry. Precision Engineering 2022;77(1):16–23 |
| Y Chen, X Zhang*, T Chen, R Zhu, L Ye, W Lang. Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces. Measurement 2022;199(1):111589 |
| X Zhao, Y Chen, Z Guo, Y Zhou, J GuoZ Liu, X Zhang, L Xiao, Y Fei, X Wu. Tunable optofluidic microbubble lens. Optics Express 2022;30(5):8317-8329 |
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