信息中心

Embedded Metrology for Surface Measurement and Inspection

Published:2018-05-14 

光科系张祥朝老师邀请了英国Huddersfield大学高峰教授来访,欢迎感兴趣的老师和学生参加,谢谢!

报告题目:Embedded Metrology for Surface Measurement and Inspection

时间:2018.5.14 下午3:00

地点:遗传楼206会议室

联系人:张祥朝

 

Copyrights 2017 © The School of Information Science and Technology, Fudan University