January 10th, 2011, SIST ushered in the first International visit.

Kenneth F. Galloway, Dean of Vanderbilt University School of Engineering, and Ronald D. Schrimpf, Professor of Vanderbilt University School of Engineering came to Fudan and had a meeting with Professor Ran Liu, the Dean of Internationalization of SIST, and Professor Yinyin Lin from Microelectronics Department. At the meeting, the two sides discussed cooperation model in student exchange and research programs, and both had strong willings to push forward collaborations between each other.

In the afternoon, Professor Galloway went to Zhangjiang Campus and made a Lab tour led by Professor Mingfu Li and Daming Huang.

It was a fruitful visit for both Fudan SIST and Vanderbilt University School of Engineering. Detailed cooperation plan between the two sides is expected to be developed soon.