Run-time VLSI Performance Adaptation and Soft Error Measurement

 

Speaker: Masanori Hashimoto (Osaka University)

Time and Date: 14:00-15:00, March 19, 2013

Place: Room 369, Microelectronics Building, Zhangjiang Campus 

 

 

Abstract

This talk consists of two parts; run-time adaptive performance control and soft error measurement and analysis. First I will present run-time adaptive performance control with on-chip sensors that predict timing errors. The sensors embedded into functional circuits capture delay variations due to not only die-to-die process variation but also random process variation, environmental fluctuation and aging. By compensating circuit performance according to the sensor outputs, we can overcome PVT worst-case design and reduce power dissipation while satisfying circuit performance. We applied the adaptive speed control to subthreshold circuits that are very sensitive to random variation and environmental fluctuation. Measurement results of a 65nm test chip show that the adaptive speed control can compensate PVT variations and improve energy efficiency by up to 46% compared to the worst-case design and operation with guardbanding. Next, I will briefly introduce results of soft error measurement and analysis for subthreshold SRAM. As supply voltage becomes lower, critical charge, which is the charge to flip a bit, becomes smaller, which means SRAM becomes more susceptible to radiation. I will present measured soft error rates from 0.3V to 1.0V in 65nm for neutron and alpha particles, and discuss their trends.

 

Bio

Masanori Hashimoto received the B.E., M.E. and Ph.D. degrees in Communications and Computer Engineering from Kyoto University, Kyoto, Japan, in 1997, 1999, and 2001, respectively. Since 2004, he has been an Associate Professor in Department of Information Systems Engineering, Osaka University. His research interest includes timing and power integrity analysis, ultra low power design, and design for variability and reliability. He served as TPC members for a number of conferences including DAC, ICCAD, ASP-DAC, ISPD, and DATE.