Surface microscopy with low energy electrons

Speaker:Prof.Ernst Bauer (ASU)

Time and Date: 14:00-15:00, Dec. 7, 2015

Place: Room 216, Physics Building, Handan Campus

 

 

Abstract

Surface microscopy with low energy electrons is one of the major laterally resolving surface and thin film characterization methods. This talk will briefly discuss the physical principles of the various imaging modes, in particular of low energy electron microscopy, will present some of the instruments used, their possibilities and limitations and illustrate their application by a number of examples.

 

 

Biography

Professor Ernst Bauer is a distinguished German- American physicist a pioneer in surface physics and inventor of microscopy techniques. He derived in 1958 the classification of thin film growth mechanisms that provides to this day the theoretical thermodynamic framework used to understand epitaxy. In 1962 he invented Low Energy Electron Microscopy (LEEM), which came to fruition in 1985. In the late eighties/early nineties he extended the LEEM technique in two directions of capital importance by developing Spin-Polarized Low Energy Electron Microscopy (SPLEEM) and Spectroscopic Photo Emission and Low Energy Electron Microscopy (SPELEEM).

 

Ernst Bauer authored or co-authored 457 publications (among them 85 review papers and book chapters) and two books: "Electron Diffraction: Theory, Practice and Applications", 1958, in German and “Surface Microscopy with Low Energy Electrons” 2014. His papers are widely cited (more than 12000 citations). The scientific achievements of Ernst Bauer have been multiply honored. Among other honors, he has received the E.W. Muller Award in 1985, the Gaede Prize of the German Vacuum Society in 1988, the Medard W. Welch Award of the American Vacuum Society in 1992, the Niedersachsenpreis for Science (Germany) in 1994, BESSY Innovation Award on Synchrotron Radiation in 2004 and the very prestigious Davisson- Germer Prize of the American Physical Society in 2005. In 2003 Ernst Bauer received the first Award of the Japan Society of Promotion of Science's 141st Committee on Microbeam Analysis and was made an honorary member of this organization. He was elected a Member of the Goettingen Academy of Sciences in 1989, Fellow of the American Physical Society in 1991 and Fellow of the American Vacuum Society in 1994.