| Y Chen, W Lang, T Chen, X Niu, X Zhang*. Enhancing the efficiency and determinacy of in-situ monoscopic phase measuring deflectometry by Bayesian approach. Precision Engineering 2025;94:693-699 |
| W Lang, X Zhang*, Y Chen, T Chen, P Yang, M Xu, X Jiang. Deterministic form-position deflectometric measurement of monolithic multi-freeform optical structures via Bayesian multisensor fusion. Light: Advanced Manufacturing 2025;6:29 |
| X Zhang*, X Ma, S Rong. Physics-informed and self-supervised multi-image super-resolution reconstruction for digital holography microscopy. Surface Topography: Metrology and Properties 2025;13:015034 |
| Z Hua , X Zhang, D Tu , X Zhang. Three-dimensional topography measurement for confocal microscopy with arrayed laser spots. IEEE Transactions on Instrumentation and Measurement 2025;74:5024816 |
| P Yang, T Chen, D Wang, L Ye, Y Chen, W Lang, X Zhang*. Recognition and separation of fringe patterns in deflectometric measurement of transparent elements based on empirical curvelet transform. Measurement 2024;237(1):115242 |
| T Chen, P Yang, W Lang, Y Chen, W Wang, X Zhang*. Integrated form-position measurement of large-aperture transparent elements based on stereoscopic phase measuring deflectometry. Surface Topography: Metrology and Properties 2024;12:025023 |
| T Chen, P Yang, X Zhang*, W Lang, Y Chen, M Xu. Separation of fringe patterns in fast deflectometric measurement of transparent optical elements based on neural network-assisted fast iterative filtering method. Advances in Manufacturing 2024;s40436-024-00509-w |
| R Xiong, X Zhang*, X Ma, L Li, Z Ni, X Jiang. Adaptive coded phase mask design and high-quality image reconstruction for interference-less coded aperture correlation holography. Optics Express 2024;32(7):12747-12762 |
| Y Chen, X Zhang*, W Lang, T Chen, Z Hu, X Jiang. Simplifying the monoscopic deflectometric measurement by extra-facility-free workpiece positioning. Precision Engineering 2024;87:97-105 |
| W Lang, X Zhang*, Y Chen, T Chen and X Jiang. Holistic calibration method of deflectometry by holonomic framework priors. Optics Letters 2024;49(3):702-705 |
| Q Lu, W Gong, Y Sun, W Wang, X Zhang, P Wang, Y Ding, W Wang*, S Liu, X Zhang, M Xu, J Shao.Fast, intelligent and high-precision adaptive interferometry for optical freeform surfaces by backpropagation. Optics Express 2024;32(2):2658-2669 |
| T Chen, Y Chen, W Lang, X Zhang, W Wang*, M Xu. In-situ sub-aperture stitching measurement based on monoscopic phase measuring deflectometry. Precision Engineering 2024;85(1):197-204 |
| C Wang, W Wang, J Wei, J Wu, X Zhang, H Zheng, F Wang, Y Yu. A phase-based reconstruction optimization method for digital holographic measurement of microstructures. Applied Optics 2023;62(17): 4530-4535 |
| W Lang, X Zhang*, Y Chen, T Chen, Z Hu and X Jiang. A general reconstruction framework for deflectometric measurement based on non-uniform B-splines. IEEE Transactions on Instrumentation and Measurement 2023;72(5): 5015511 |
| Z Hu, X Zhang*, W Lang, Y Chen, T Chen and M Xu. Fast measurement of surface topographies using a phase-measuring deflectometric microscopy. IEEE Photonics Journal 2023;15(2):6800807 |
| J Wang, L Peng, F Zhai, D Tang*, F Gao, X Zhang*, R Chen, L Zhou* and X Jiang. Polarized angle-resolved spectral reflectometry for real-time ultra-thin film. Optics Express 2023;31(4):6552-6565 |
| X Zhang*, H Yuan, R Xiong, J Wang*, X Ma, Z Hu and M Xu. Fast measurement of surface defects on large components with dynamic phase-shifting digital holographic microscopy. Measurement 2023;208(1):112443 |
| R Xiong, X Zhang*, X Ma, L Li, J Wang* and X Jiang. Full-dimensional surface characterization based on polarized coherent coded aperture correlation holography. IEEE Photonics Journal 2022;14(6):3160407 |
| K Wang,YQ Zhu,QC An, XC Zhang, C Peng, HR Meng and XY Liu. An even sampling photonic-integrated interferometric array for synthetic aperture imaging. Optics Express 2022;30(18):32119-32128 |
| F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Depth multiplexing of orbital angular momentum holography. Optics Express 2022;30(18):31863-31871 |
| Z Niu, Z Wu, S Wan, X Zhang*, C Wei*, J Shao. Iterative space-variant sphere-model deflectometry enabling designation-model-free measurement of the freeform surface. Optics Express 2022;30(9):14019-14032 |
| F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Angular multiplexation of partial helical phase modes in orbital angular momentum holography. Optics Express 2022;30(7):11110-11119 |
| T Chen, Y Chen, X Zhang, W Wang*, M Xu. Workpiece positioning and error decoupling in the single-point diamond turning of freeform mirrors based on the monoscopic deflectometry. Precision Engineering 2022;77(1):16–23 |
| Y Chen, X Zhang*, T Chen, R Zhu, L Ye, W Lang. Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces. Measurement 2022;199(1):111589 |
| X Zhao, Y Chen, Z Guo, Y Zhou, J GuoZ Liu, X Zhang, L Xiao, Y Fei, X Wu. Tunable optofluidic microbubble lens. Optics Express 2022;30(5):8317-8329 |
光科学与工程系
职称：研究员、专博博导
职务：工程中心副主任
电子邮件：zxchao@fudan.edu.cn
办公地点：江湾校区交叉二号楼C3013
电话：021-31242566
课题组主页：